Global Vertical Probe Cards Market Research Report 2019

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In this report, the Global Vertical Probe Cards Market market is valued at USD XX million in 2019 and is expected to reach USD XX million by the end of 2026, growing at a CAGR of XX% between 2019 and 2026. Global Vertical Probe Cards Market market has been broken down by major regions, with complete market estimates on the basis of products/applications on a regional basis.

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Vertical-Probe refers to vertical-needle-type probe cards suitable for multi-die testing of general logic products, including SoC and microcomputer products. A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged. It consists, normally, of a printed circuit board (PCB) and some form of contact elements, usually metallic, but possibly of other materials as well.

The global Vertical Probe Cards market is valued at xx million US$ in 2018 is expected to reach xx million US$ by the end of 2025, growing at a CAGR of xx% during 2019-2025.

This report focuses on Vertical Probe Cards volume and value at global level, regional level and company level. From a global perspective, this report represents overall Vertical Probe Cards market size by analyzing historical data and future prospect. Regionally, this report focuses on several key regions: North America, Europe, China and Japan.

At company level, this report focuses on the production capacity, ex-factory price, revenue and market share for each manufacturer covered in this report.

The following manufacturers are covered:


Micronics Japan (MJC)


Japan Electronic Materials (JEM)

SV Probe

Korea Instrument


Synergie Cad Probe

TIPS Messtechnik GmbH

STAr Technologies´╝îInc


Segment by Regions

North America




Segment by Type

Parametric Vertical Probe Card

Mixed-Signal Vertical Probe Card

Vertical MEMS Probe Card

Segment by Application

Foundry & Logic




Others (RF/MMW/Radar, etc.)

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